LaserSKI: Object Detection for Defect Detection in Semiconductors

In this talk, William Clemens (PhD) presented our work about detecting defects in manufacturing processes of semiconductors.

By utilizing convolutional neural networks, the system inspects images of semiconductors to identify and classify defects, enhancing the efficiency and reliability of quality control, with the goal of reducing monotonous manual inspections.

LaserSKI was a joint project of three industrial manufacturers of laser diodes as well as the Ferdinand-Braun-Institut and Leibniz-Institut für Höchstfrequenztechnik (FBH).

The talk was given at the Applied Machine Learning Days (AMLD) 2022.